Summaries by Inventor Lew, Matthew

User-friendly methods to detect artifacts in super-resolution microscopy
Lew, Matthew ; Mazidisharfabadi, Hesamaldin ; Nehorai, Arye
T-019008

— Engineers at Washington University have devised an automated system to enhance super-resolution microscopy images by detecting and quantifying image artifacts using no a priori information. This project stems from the advanced imaging research in Prof. Matthew Lew’s laboratory that includes op…